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NBTI_presentation

저작시기 2013.04 |등록일 2014.08.18 파워포인트파일MS 파워포인트 (pptx) | 9페이지 | 가격 1,500원

목차

1. What is NBTI?
2. Back to major reliability concern
3. Dual poly-process
4. Reaction-diffusion Model
5. Nitridation

본문내용

What is NBTI?
▶ Negative Bias Temperature Instability (NBTI)
▷ Instability of PMOS transistor parameters under negative bias and high temperature
→ Threshold voltage, trans-conductance, saturation current, etc.
▷ Persistent reliability concern for CMOS technology below 130 nm nodes

Typical degradation characteristics of NBTI
Id-Vg and gm-Vg curves for fresh device (full line) and after 10,000 s of stress (dashed line) for a p-MOSFET device with a 2 nm-thick oxide at 125 °C in the linear regime

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